Center for Multidimensional Carbon Materials

The Epitaxy of 2D Materials Growth

Jichen Dong, Leining Zhang, Xinyue Dai, Feng Ding [Nature Communications 11, 5862(2020)]

The Wrinkle Formation in Graphene on Transition Metal Substrate: A Molecular Dynamics Study

Chao Zhao, Fengning Liu, Xiao Kong, Tianying Yan, Feng Ding [International Journal of Smart and Nano Materials 11, 3, 277-287(2020)]

Mechanisms of Liquid-Phase Exfoliation for the Production of Graphene

Zheling Li, Robert J. Young, Claudia Backes, Wen Zhao, Xun Zhang, Alexander A. Zhukov, Evan Tillotson, Aidan P. Conlan, Feng Ding, Sarah J. Haigh, Kostya S. Novoselov, Jonathan N. Coleman [ACS Nano 14, 9, 10976-10985(2020)]

Mussel Inspired Highly Aligned Ti3C2Tx MXene Film with Synergistic Enhancement of Mechanical Strength and Ambient Stability

Gang San Lee, Taeyeong Yun, Hyerim Kim, In Ho Kim, Jungwoo Choi, Sun Hwa Lee, Ho Jin Lee, Ho Seong Hwang, Jin Goo Kim, Dae-won Kim, Hyuck Mo Lee, Chong Min Koo, Sang Ouk Kim [ACS Nano 14, 9, 11722-11732(2020)]

Contrast Transfer Function-Based Exit-Wave Reconstruction and Denoising of Atomic-Resolution Transmission Electron Microscopy Images of Graphene and Cu Single Atom Substitutions by Deep Learning Framework

Jongyeong Lee, Yeongdong Lee, Jaemin Kim, Zonghoong Lee [Nanomaterials 10, 10, 1977(2020)]

Family of Magic‐Sized Carbon Clusters on Transition Metal Substrates

Xue Yan, Xi Wu, Xiaobin Chen, Hongda Du, Lin Gan, Feiyu Kang, Feng Ding, Jia Li [Advanced Functional Materials 30, 52, 2006671(2020)]

Synthesis of a Copper 1,3,5-Triamino-2,4,6-benzenetriol Metal–Organic Framework

Yi Jiang, Inseon OhInseon Oh Department of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, Republic of Korea More by Inseon Oh , Se Hun Joo, Yu-Seong Seo, Sun Hwa Lee, Won Kyung Seong, Yu Jin Kim [Journal of the American Chemical Society 142, 43, 18346-18354(2020)]

Reference-free THz-TDS Conductivity Analysis of Thin Conducting Films

Patrick R. Whelan, Qian Shen, Da Luo, Meihui Wang, Rodney S. Ruoff, Peter U. Jepsen, Peter Bøggild, Binbin Zhou [Optics Express 28, 20, 28819-28830(2020)]