Structure surface characterization > Equipment > Public

To explore new physics phenomena of low dimensional materials
with a special emphasis on two-dimensional layered structures

Reservation

In ultrahigh vacuum SPM chamber, we can change the temperature 50[K] to 500[K] of several type of sample.

And by using STM or scanning sensor in Beam deflection AFM, we can see the surface image of sample in low temperature.

VT AFM XA 50/500

UHV Vacuum Sys. Bench & SPM Chamber

Matrix SPM Control Sys. Digital Temp Controller, LEED Package

Center for Integrated Nanostructure Physics