To explore new physics phenomena of low dimensional materials
with a special emphasis on two-dimensional layered structures
Model | Alpha300 SR 외 3 |
---|---|
Operating time |
SUN(00:00~24:00) MON(00:00~24:00) TUE(00:00~24:00) WED(00:00~24:00) THU(00:00~24:00) FRI(00:00~24:00) SAT(00:00~24:00) |
Location | 86191 |
inquiry |
EunJi Lee 010-8671-3369 |
Available Time // 09:00 ~ 18:00 on every Tue. Wed.
Notice // If you want to have training for using this equipment, please contact Super-user.
Current Status // Now on operation.
A microscope system to obtain the high spatial resolved images using small apperture below the diffaction limit
- Scanning Near-field Optical Microscopy (SNOM) modes : bottom up and top down mode (apperture size : 60 [nm], 90 [nm])
- Confocal microscopy : transmission, reflection, fluorescence, Raman, polarization, lithography, air and liquid measurements, temperature-controlled
- Atomic Force Microscopy : contact, lateral force, pulsed force and AC-Mode, MFM, nanolithography/nanomanipulation, air and liquid measurements, temperature-controlled
- Usually 120 [mm] in x- and y-direction, 25 [mm] in height (adapter for larger heights available)