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To explore new physics phenomena of low dimensional materials
with a special emphasis on two-dimensional layered structures

Board

Tutorials for XRD measurements and applications started from last Friday (May 31).

Please refer below detailed information.

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1st session (May 31 Fri. 13:00-17:00)

[Basics of X-ray and x-ray powder diffraction]

- X-ray generation & characteristics.

- X-ray diffractometer & basic theory.

- X-ray powder diffraction & applications.

2nd session (Jun. 4 Tue. 13:00-17:00)

[Thin-film measurement & XRR]

- Theory and system configuration for thin-film measurement.

- Thin-film measurement & applications.

- X-ray reflectometry (XRR).

3rd session (Jun. 7 Fri. 13:00-17:00)

[High resolution XRD & in-plane measurement]

- Theory & system configuration for high resolution XRD.

- Applications of high resolution XRD.

- In-plane measurement (GIXRD).

4th session (Jun. 12 Tue. 13:00-17:00)

[Applications of Rigaku softwares & practices]

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● Location: Room 85492 (Corporate Collaboration Center)

● Instrument: Rigaku SmartLab

● Instructor: Korea ITS Lee, Han Joon & Park, Se Jeong.

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* Potential user who wants to use XRD system should register with your personal information (name, phone number,

research group) through email in advance and participate these tutorials.

** Tutorials will be performed in Korean.

*** If you have any questions about these programs, please contact Prof. Jae Yeol Hwang at jy.hwang@skku.edu or 031-299-6995.

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