Model | NX10(PARK Systems) |
---|---|
Operating time | 09:00 ~ 18:00 |
Location | POSTECH Research Bldg. #110 |
inquiry |
Dr. Baek, Kangkyun 054-279-9949 k2baek@ibs.re.kr |
Explanation
Atomic-force microscopy (AFM) or scanningforce microscopy (SFM) is a very high-resolution type of scanning probe microscopy (SPM), withdemonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. Using an atomic-force microscope (AFM), it is possible to measure a roughness of a sample surface at a high resolution, to distinguish a sample based on its mechanical properties and, in addition, to perform a microfabrication of a sample.
Specification
● Motorized stage
- sample size: up to 50 mm x 50 mm, up to 20 mm thickness
- sample weight: up to 500 g
- XY stage travel: 20 mm x 20 mm
- Z stage travel: 22 mm
- Focus stage travel: 15 mm
● XY Scanner & Z Scanner
- XY scanner: 50 m x 50 m, 0.05 nm resolution, less than 2 nm out-of-plane motion
- Z scanner: 15 m, 0.015 nm resolution
● Imaing modes
- True non-contact AFM, PinPointTM AFM, contact AFM, (lateral force microscopy) LFM, phase imaging, tapping AFM
- Electric force microscopy (EFM), dynamic contact EFM (EFM-DC), piezoelectric force microscopy (PFM), PFM with high voltage
- Magnetic force microscopy (MFM), tunable MFM
- Conductive AFM, IV spectroscopy, scanning tunneling microscopy (STM)
● Temperature controllable closed liquid/gas cell
- cell volumn:1000 L, dia. 15 mm, thickness 1.5 mm
- temperature range: 0C - 110C, 4C - 70C (in solution)